May 31 – June 5, 2009
Henry B. Gonzalez Convention Center, San Antonio, TX, U.S.A.
At Display Week 2009 in San Antonio, Texas, May 31 – June 5, 2009, DuPont OLED Displays representatives will be participating in a roundtable discussion during the Business Conference, and making two key technical presentations during the Symposium.
Dr. William Feehery, Global Business Director, DuPont OLED Displays, will take part in the Business Conference round table discussion beginning at 1:50pm on June 1, entitled, “Competing with TFT LCD: OLED, MEMS and Other Alternatives”.
- Representatives from OLED and MEMS-based display developers will discuss the challenges and opportunities of "innovating around" TFT-LCD, by developing display technologies with the promise of some combination of lower manufacturing cost and higher performance.
Dr. Marie O'Regan, Technology Director, will present findings on, “Solution-Processed OLED Displays: Advances in Performance, Resolution, Lifetime, and Appearance,” at 9:40 AM on Thursday, June 4 in Ballroom C3.
- Progress made on the fabrication of active-matrix OLED displays using low-cost solution methods, including slot coating of continuous, unpatterned layers and solution printing of the emissive layer, will be reviewed. Advances in performance, resolution, lifetime, and appearance will be shown. Progress towards Gen 4 manufacturing-line equipment will also be discussed.
Dr. Reid Chesterfield, Printing Development Manager will describe “Multinozzle Printing: A Cost-Effective Process for OLED-Display Fabrication” at 9:00 AM on Friday, June 5, 2009 in Room 217A/B.
- Cost-effective and scalable patterning of OLED materials remains a key challenge in order for OLED displays to achieve widespread FPD-market penetration. Progress on the continuous solution printing of the small-molecule emissive layers using a Gen 4 multinozzle printer will be reviewed. Drying defects such as stitching/swath marks and thickness non-uniformity, present under certain circumstances, will be discussed as well as solutions to these defects currently under development. Recent progress will be presented.
Please Contact Us for more information about our activities at SID 2009.